Please use this identifier to cite or link to this item: http://buratest.brunel.ac.uk/handle/2438/9799
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dc.contributor.authorWang, BX-
dc.contributor.authorYu, K-
dc.contributor.authorSheng, Z-
dc.date.accessioned2015-01-19T12:53:13Z-
dc.date.available2014-
dc.date.available2015-01-19T12:53:13Z-
dc.date.issued2014-
dc.identifier.citationIEEE Transactions on Reliability, 63 (3): 807 - 815, (2014)en_US
dc.identifier.issn0018-9529-
dc.identifier.urihttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6782725-
dc.identifier.urihttp://bura.brunel.ac.uk/handle/2438/9799-
dc.descriptionThis article has been made available through the Brunel Open Access Publishing Fund.-
dc.description.abstractConstant-stress procedures based on parametric lifetime distributions and models are often used for accelerated life testing in product reliability experiments. Maximum likelihood estimation (MLE) is the typical statistical inference method. This paper presents a new inference method, named the random variable transformation (RVT) method, for Weibull constant-stress accelerated life tests with progressively Type-II right censoring (including ordinary Type-II right censoring). A two-parameter Weibull life distribution with a scale parameter that is a log-linear function of stress is used. RVT inference life distribution parameters and the log-linear function coefficients are provided. Exact confidence intervals for these parameters are also explored. Numerical comparisons of RVT-based estimates to MLE show that the proposed RVT inference is promising, in particular for small sample sizes.en_US
dc.format.extent807 - 815-
dc.format.extent807 - 815-
dc.languageeng-
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.subjectAccelerated life-testingen_US
dc.subjectCensored dataen_US
dc.subjectConfidence intervalen_US
dc.subjectMaximum likelihood estimationen_US
dc.subjectProgressively censoringen_US
dc.subjectRandom variable transformationen_US
dc.subjectWeibull distributionen_US
dc.titleNew inference for constant-stress accelerated life tests with Weibull distribution and progressively type-II censoringen_US
dc.typeArticleen_US
dc.identifier.doihttp://dx.doi.org/10.1109/TR.2014.2313804-
dc.relation.isPartOfIEEE Transactions on Reliability-
dc.relation.isPartOfIEEE Transactions on Reliability-
pubs.issue3-
pubs.issue3-
pubs.volume63-
pubs.volume63-
pubs.organisational-data/Brunel-
pubs.organisational-data/Brunel/Brunel Staff by College/Department/Division-
pubs.organisational-data/Brunel/Brunel Staff by College/Department/Division/College of Engineering, Design and Physical Sciences-
pubs.organisational-data/Brunel/Brunel Staff by College/Department/Division/College of Engineering, Design and Physical Sciences/Dept of Mathematics-
pubs.organisational-data/Brunel/Brunel Staff by College/Department/Division/College of Engineering, Design and Physical Sciences/Dept of Mathematics/Mathematical Sciences-
pubs.organisational-data/Brunel/Brunel Staff by Institute/Theme-
pubs.organisational-data/Brunel/Brunel Staff by Institute/Theme/Institute of Environmental, Health and Societies-
pubs.organisational-data/Brunel/Brunel Staff by Institute/Theme/Institute of Environmental, Health and Societies/Health Economics-
Appears in Collections:Brunel OA Publishing Fund
Dept of Mechanical Aerospace and Civil Engineering Research Papers

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