Please use this identifier to cite or link to this item: http://buratest.brunel.ac.uk/handle/2438/2734
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dc.contributor.authorSmith, DR-
dc.contributor.authorHolland, AD-
dc.contributor.authorRobbins, MS-
dc.coverage.spatial4en
dc.date.accessioned2008-10-08T09:47:56Z-
dc.date.available2008-10-08T09:47:56Z-
dc.date.issued2003-
dc.identifier.citationNuclear Instruments and Methods. A513: 296-99en
dc.identifier.urihttp://bura.brunel.ac.uk/handle/2438/2734-
dc.description.abstractThe effect of different 10 MeV equivalent proton fluences on the performance of E2V Technologies (formerly Marconi applied technologies, formerly EEV) L3Vision Charge Coupled Devices (CCDs) was investigated. The first experimental radiation damage results of the L3Vision device are presented, with emphasis given to the analysis of damage to the gain register of the device. Changes in dark current and generation of bright pixels in the CCD image, store, readout register and gain register as a result of proton irradiation are reported and viewed in light of the potential use of the device in space-based applications.en
dc.format.extent251124 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoen-
dc.publisherElsevieren
dc.subjectCharge coupled deviceen
dc.subjectProtonen
dc.subjectRadiationen
dc.subjectLow light levelen
dc.subjectL3Visionen
dc.subjectDamageen
dc.titleThe effect of protons on E2V technologies L3Vision CCDsen
dc.typeResearch Paperen
Appears in Collections:Electronic and Computer Engineering
Dept of Electronic and Computer Engineering Research Papers

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