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Title: The effect of protons on E2V technologies L3Vision CCDs
Authors: Smith, DR
Holland, AD
Robbins, MS
Keywords: Charge coupled device;Proton;Radiation;Low light level;L3Vision;Damage
Issue Date: 2003
Publisher: Elsevier
Citation: Nuclear Instruments and Methods. A513: 296-99
Abstract: The effect of different 10 MeV equivalent proton fluences on the performance of E2V Technologies (formerly Marconi applied technologies, formerly EEV) L3Vision Charge Coupled Devices (CCDs) was investigated. The first experimental radiation damage results of the L3Vision device are presented, with emphasis given to the analysis of damage to the gain register of the device. Changes in dark current and generation of bright pixels in the CCD image, store, readout register and gain register as a result of proton irradiation are reported and viewed in light of the potential use of the device in space-based applications.
Appears in Collections:Electronic and Computer Engineering
Dept of Electronic and Computer Engineering Research Papers

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