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dc.contributor.authorSmith, DR-
dc.contributor.authorHolland, AD-
dc.contributor.authorHutchinson, IB-
dc.identifier.citationNuclear Instruments and Methods, A530: 521-535en
dc.description.abstractAn investigation of fluctuating pixels resulting from proton irradiation of an E2V Technologies CCD47-20 device is presented. The device structure,experimental set up and irradiation methodology are described, followed by a detailed analysis of radiation induced random telegraph signals,RTS. The characteristics of the observed flickering pixels are discussed in detail and the proposed models explaining the mechanism behind the phenomena are viewed in light of the collected data.en
dc.format.extent556230 bytes-
dc.subjectRandom telegraph signalen
dc.subjectCharge coupled deviceen
dc.subjectRadiation damageen
dc.titleRandom telegraph signals in charge coupled devicesen
dc.typeResearch Paperen
Appears in Collections:Electronic and Computer Engineering
Dept of Electronic and Computer Engineering Research Papers

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