Please use this identifier to cite or link to this item: http://buratest.brunel.ac.uk/handle/2438/10716
Title: Characterization of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements
Authors: Bodea, MA
Pedarnig, JD
Withnell, TD
Weber, HW
Cardwell, DA
Hari Babu, N
Koblischka-Veneva, A
Keywords: Nano-Composite;Superconductors;Electron backscatter Diffraction
Issue Date: 2010
Citation: Journal of Physics: Conference Series, 2010, 234 (PART 1)
Abstract: Thin films of nano-composite Y-Ba-Cu-O (YBCO) superconductors containing nano-sized, non-superconducting particles of Y2Ba 4CuMOx (M-2411 with M = Ag and Nb) have been prepared by the PLD technique. Electron backscatter diffraction (EBSD) has been used to analyze the crystallographic orientation of nano-particles embedded in the film microstructure. The superconducting YBa2Cu3O7 (Y-123) phase matrix is textured with a dominant (001) orientation for all samples, whereas the M-2411 phase exhibits a random orientation. Angular critical current measurements at various temperature (T) and applied magnetic field (B) have been performed on thin films containing different concentration of the M-2411 second phase. An increase in critical current density J c at T < 77 K and B < 6 T is observed for samples with low concentration of the second phase (2 mol % M-2411). Films containing 5 mol % Ag-2411 exhibit lower Jc than pure Y-123 thin films at all fields and temperatures. Samples with 5 mol % Nb-2411 show higher Jc(B) than phase pure Y-123 thin films for T < 77 K.
URI: http://bura.brunel.ac.uk/handle/2438/10716
DOI: http://dx.doi.org/10.1088/1742-6596/234/1/012006
ISSN: 1742-6588
1742-6596
Appears in Collections:Brunel Centre for Advanced Solidification Technology (BCAST)

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